检测仪器置换
仪器置换，是用手头的同类仪器来置换新仪器，就是将卖旧仪器和买新仪器两个过程合并成了一个过程。
一 是同品牌内的旧仪器换新仪器
二 是多品牌置换某一品牌新仪器的业务
三 不同品牌仪器之间以旧换旧
少量二手CDE resmap178客户考虑转让
少量二手CVP21 客户考虑转让
TLM-SCAN+
TLM-SCAN+ Contact resistivity and more This compact instrument measures contact resistivity, finger line resistance, finger width, and finger height of a finished solar cell or on test structures. Motorized in all axes it is capable of creating maps of all these methods by pushing a single button. Four point probe heads for measuring the sheet resistance of thin diffused layers and resistivity of wafers make the TLM-SCAN+ a low-cost yet fast and high-quality four-point-probe mapper.
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WAFER PROFILER CVP21
The Wafer Profiler CVP21 is a handy tool to measure doping profiles in semiconductor layers by Electrochemical Capacitance Voltage Profiling (ECV-Profiling, CV-Profiling) in semiconductor research or production. This ECV Profiler (CV-Profiler, C-V-Profiler) furthermore is a very good choice to analyze or develop strategies for Photo-Electrochemical Wet Etching (PEC-Etching) of semiconductors
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