Products tagged with 'WCT-120'

The wafer measurement instrument offering the best available calibrated analysis of carrier recombination lifetime. Fully compliant with SEMI Standard PV-13. The WCT-120 is an affordable, tabletop silicon lifetime and wafer metrology system, suitable for both device research and industrial process control. The WCT-120MX is optimized for 230mm wafer measurements. The WCT-120 instruments utilize both the QSSPC and transient photoconductance decay techniques to measure the lifetimes of wafers in the range of 10ns to greater than 10ms. The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low lifetime samples. The transient photoconductance decay technique is ideal for monitoring high lifetime samples at various processing steps. The WCT-120 lifetime measurement also yields the implied open-circuit voltage (versus illumination) curve, which is comparable to an l-V curve at each stage of a solar cell process.

Sinton少子寿命测试仪 SunsVoc Mx 对于糊烧的优化和过程控制来说是一台优秀的设备。开路方法表明了太阳能电池前体在结形成之后的数值。