TLM-SCAN+
Contact resistivity and more
This compact instrument measures contact resistivity, finger line resistance, finger width, and finger height of a finished solar cell or on test structures.
Motorized in all axes it is capable of creating maps of all these methods by pushing a single button.
Four point probe heads for measuring the sheet resistance of thin diffused layers and resistivity of wafers make the TLM-SCAN+ a low-cost yet fast and high-quality four-point-probe mapper.
Four-point-probe mapping with handling system
This off-line instrument is a sheet resistance mapper for the automatic measurement of a stack of more than 100 wafers. The handling time is around 10 seconds, the supported wafer size is between 70 x 70 mm and 166 x 166 mm.
This compact instrument is motorized in all axes to create mappings of sheet resistance and wafer resistivity with 100 points in less than 4 minutes. Single points can be re-measured after navigating the probe head to the desired location with a click on the map.
This table instrument measures mappings of the short circuit current and the reflectance at 6 discrete wavelengths between 405 nm and 1064 nm simultaneously at a speed of 10 ms per pixel. PIXIE calculates these maps into maps of effective diffusion length, base saturation current, dead layer thickness, and current collection probability for surface-generated carriers. The spot size is approximately 100 µm. Intensity variations of the light sources are cancelled out using a monitor detector. We provide costum chucks to make contacting your type of solar cell easy.
