Minority Carrier Lifetime Tester

Sinton BCT-400 少子寿命测量仪 是基于涡流传感器和红外光致光电导方法直接测量单晶或者多晶硅棒体少子寿命的设备，具有瞬态和准稳态两种测量模式。该设备可探测3mm 深度范围少子寿命，并能输出不同载流子注入水平下的少子寿命值，可实现低电阻率硅单晶少子寿命测量，并能通过软件端光强偏置实现单晶缺陷密度计算。

Sinton少子寿命测试仪 BCT400/BLS-1 不用接触就可以简单准确地测量原生或成型硅块的真实寿命。与半导体工业标准PV(光伏）－13相符合。

The wafer measurement instrument offering the best available calibrated analysis of carrier recombination lifetime. Fully compliant with SEMI Standard PV-13. The WCT-120 is an affordable, tabletop silicon lifetime and wafer metrology system, suitable for both device research and industrial process control. The WCT-120MX is optimized for 230mm wafer measurements. The WCT-120 instruments utilize both the QSSPC and transient photoconductance decay techniques to measure the lifetimes of wafers in the range of 10ns to greater than 10ms. The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low lifetime samples. The transient photoconductance decay technique is ideal for monitoring high lifetime samples at various processing steps. The WCT-120 lifetime measurement also yields the implied open-circuit voltage (versus illumination) curve, which is comparable to an l-V curve at each stage of a solar cell process.

Sinton少子寿命测试仪 SunsVoc Mx 对于糊烧的优化和过程控制来说是一台优秀的设备。开路方法表明了太阳能电池前体在结形成之后的数值。

用于单晶硅锭、硅砖和硅晶圆片的生产和质量监控。用于HJT、HIT、TOPcon、双面PERC、PERC+太阳能电池、钙钛矿等中的硅材料。特征直拉硅单晶硅锭中的滑移线寿命范围20ns至100ms（样品电阻率>0.3Ohmcm）SEMI标准PV9-1110

用于单晶硅锭、硅砖和硅晶圆片的生产和质量监控。 用于HJT、HIT、TOPcon、双面PERC、PERC+太阳能电池、钙钛矿等中的硅材料。