Hisomet DH2HISOMET realizes non-contact, high-precision height/depth measurement with simple operation, observing the surface of measuring point. HISOMET-II is a non-contact depth measuring microscope that has been designed based on an optical type focal point detection system. Adopting precise focus indicator, it’s possible to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule. Since there are no concern for physical damages such as distortion, blow or nicks to a specimen because of non-contact system, HISOMET is optimum for measuring electronic components such as ICs or high-precision processing parts.Call for pricingQty: Add to cart Custom wishlist OKAdd to wishlistAdd to compare listEmail a friendHisomet DH2HISOMET realizes non-contact, high-precision height/depth measurement with simple operation, observing the surface of measuring point. HISOMET-II is a non-contact depth measuring microscope that has been designed based on an optical type focal point detection system. Adopting precise focus indicator, it’s possible to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule. Since there are no concern for physical damages such as distortion, blow or nicks to a specimen because of non-contact system, HISOMET is optimum for measuring electronic components such as ICs or high-precision processing parts.Features:Z-axis measurement range 25mmMeasuring unit Digital indicator, minimum reading to 0.1µmPrecise focus indicator Black and white built-in index graticules to be selected.
